Esposito, M., Raggiunto, S., Sabbatini, L., Belli, A., Bruschi, S., Palma, L., Storti, E., Rossini, S., & Pierleoni, P
Published in:
2025 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 1-6. IEEE